The micro and nano fabricated components are investigated on a wafer scale using focused ion beam milling combined with electron beam lithography. The advancing technology in active devices such as microprocessors and microcontrollers has made the research of their electrical characteristics crucial. Special instrumentation is used for analyzing the output of the transistors, from which the speed, power, and noise margins are deduced. The static tester makes it possible to characterize linear and non-linear electrical properties of active devices such as MOSFETs, IGBTs, bipolar and high frequency transistors. Equipment in this laboratory program includes a high-precision tester, a mechanical tester, a tester system for silicon photonics, a composite tester, an electro-optics test environment, a dynamic thermal tester, a thermal test chamber, a physical characterization system for wafers with optical access, and an instrumented probe station.
This laboratory is dedicated to characterizing the physical properties of electronic devices, including electrical and thermal properties, mechanical deflection, physical, electrical, and magnetic characteristics. Lab users are encouraged to use the equipment to determine the characteristics of a wide variety of photonic devices, including, but not limited to, lasers, waveguides, detectors, and pigtailed components.
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